Autori: Stanimirovic Zdravko I
| Naslov | Multiple high-voltage pulse stressing of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Ivanka P  Jevtic Milan M Stanimirovic Zdravko I
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| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 12 , Suppl. , str. 2242 -2248 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Influence of simultaneous mechanical and electrical straining on conventional thick-film resistors (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P
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| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 627-630 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Performances of conventional thick-film resistors after multiple high-voltage pulse (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I
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| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 623-625 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Computer simulation of thick-film resistors based on 3D planar RRN model (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P
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| Info | Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1687-1690 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Performances of conventional thick-film resistors subjected to mechanical straining (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P
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| Info | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 675-678 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | High-voltage pulse stressing of thick-film resistors and noise (Article) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I
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| Info | MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 6, str. 905-911 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Evaluation of thick-film resistor structural parameters based on noise index measurements (Article) |
| Autori | Jevtic Milan M Stanimirovic Zdravko I Stanimirovic Ivanka P
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| Info | MICROELECTRONICS RELIABILITY, (2001), vol. 41 br. 1, str. 59-66 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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