Autori: Mitrovic Nikola I
Naslov | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article) |
Autori | Zivanovic Emilija N Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Dankovic Danijel M |
Info | MICROMACHINES, (2024), vol. 15 br. 4, str. - |
Projekat | Serbian Ministry of Science, Technological Development and Innovation |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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Naslov | Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System (Proceedings Paper) |
Autori | Andjelkovic Marko Lj ... Ilic Stefan D Marjanovic Milos B Veljkovic Sandra Mitrovic Nikola I Dankovic Danijel M Ristic Goran S ... (broj koautora 18) |
Info | 2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023, (2023), vol. br. , str. 286-293 |
Projekat | EU [857558] |
Ispravka | Web of Science Članak |
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Naslov | Self-heating of stressed VDMOS devices under specific operating conditions (Article) |
Autori | Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Zivanovic Emilija N Paskaleva Albena Spassov Dencho Mancic Dragan D Dankovic Danijel M |
Info | MICROELECTRONICS RELIABILITY, (2023), vol. 150 br. , str. - |
Projekat | Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102]; Bulgarian National Scientific Fund [KP-06-H37/32]; [SPS G5974] |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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Naslov | The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering (Article) |
Autori | Dankovic Danijel M Marjanovic Milos B Mitrovic Nikola I Zivanovic Emilija N Dankovic Milan Prijic Aneta P Prijic Zoran D |
Info | IEEE TRANSACTIONS ON EDUCATION, (2023), vol. 66 br. 2, str. 146-155 |
Projekat | Serbian Ministry of Education, Science, and Technological Development [451-0368/2022-14/200102] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article) |
Autori | Mitrovic Nikola I Veljkovic Sandra Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Zivanovic Emilija N Prijic Zoran D Dankovic Danijel M |
Info | MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. - |
Projekat | European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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Naslov | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article) |
Autori | Veljkovic Sandra Mitrovic Nikola I Davidovic Vojkan S Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stankovic Srboljub J Andjelkovic Marko Lj Prijic Zoran D Manic Ivica Dj Prijic Aneta P Ristic Goran S Dankovic Danijel M |
Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. - |
Projekat | European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article) |
Autori | Dankovic Danijel M Davidovic Vojkan S Golubovic Snezana M Veljkovic Sandra Mitrovic Nikola I Djoric-Veljkovic Snezana M |
Info | MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. - |
Projekat | Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Practical Methods for Teaching of Solar Cell Characterization (Proceedings Paper) |
Autori | Mitrovic Nikola I Stojanovic Milan D |
Info | 2020 55TH INTERNATIONAL SCIENTIFIC CONFERENCE ON INFORMATION, COMMUNICATION AND ENERGY SYSTEMS AND TECHNOLOGIES (IEEE ICEST 2020), (2020), vol. br. , str. 85-88 |
Projekat | Ministry of Education, Science and Technological Developmentof the Republic of Serbia |
Ispravka | Web of Science Citati: Web of Science Scopus |
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Naslov | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method (Article) |
Autori | Mitrovic Nikola I Dankovic Danijel M Randjelovic Branislav M Prijic Zoran D Stojadinovic Ninoslav D |
Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2020), vol. 50 br. 3, str. 205-214 |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia; Serbian Academy of Science and Arts |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Modeling of NBTS Effects in P-Channel Power VDMOSFETs (Article) |
Autori | Dankovic Danijel M Mitrovic Nikola I Prijic Zoran D Stojadinovic Ninoslav D |
Info | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (2020), vol. 20 br. 1, str. 204-213 |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Serbian Academy of Sciences and Arts [F-148] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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