Autori: Kopsalis I
| Naslov | Probing high-energy ion-implanted silicon by micro-Raman spectroscopy (Article) |
| Autori | Kopsalis I Paneta V Kokkoris Michael Liarokapis Efthymios Eric Marko V Petrovic Srdjan M  Fazinic Stjepko Tadic T
|
| Info | JOURNAL OF RAMAN SPECTROSCOPY, (2014), vol. 45 br. 8, str. 650-656 |
| Projekat | European Community as an Integrating Activity 'Support of Public and Industrial Research Using Ion Beam Technology (SPIRIT)' under EC [227012]; Ministry of Education, Science, and Technological Development of Serbia [III 45006] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
     |
| Naslov | Investigation of deep implanted carbon and oxygen channeling profiles in [110] silicon, using d-NRA and SEM (Article) |
| Autori | Paneta V Eric Marko V Fazinic Stjepko Kokkoris Michael Kopsalis I Petrovic Srdjan M Tadic T
|
| Info | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, (2014), vol. 320 br. , str. 6-11 |
| Projekat | "Support of Public and Industrial Research Using Ion Beam Technology (SPIRIT)" as an Integrated Infrastructure Initiative project; European Commission, under EC [227012]; Ministry of Education, Science and Technological Development of Serbia [III 45006] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
|
|
