Autori: Stojadinovic Ninoslav D
| Naslov | Spontaneous recovery in DC gate bias stressed power VDMOSFETs (Proceedings Paper) |
| Autori | Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 639-644 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices (Proceedings Paper) |
| Autori | Vracar Ljubomir M Pesic Biljana Stojadinovic Ninoslav D |
| Info | Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1159-1162 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Manic Ivica Dj Golubovic Snezana M |
| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of electrical stressing in power VDMOSFETS (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima |
| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Kouvatsos DN Davidovic Vojkan S Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D |
| Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs (Proceedings Paper) |
| Autori | Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 701-704 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | An improved analytical model of IGBT in forward conduction mode (Proceedings Paper) |
| Autori | Pavlovic Zoran Manic Ivica Dj Stojadinovic Ninoslav D |
| Info | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 163-166 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Effects of electrical stressing in power VDMOSFETs (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima |
| Info | 2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, (2003), vol. br. , str. 291-296 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Computer controlled equipment for laboratory exercises in physics and electronics (Proceedings Paper) |
| Autori | Vracar Ljubomir M Stojadinovic Ninoslav D Ackovic B Jovanovic S |
| Info | IEEE REGION 8 EUROCON 2003, VOL A, PROCEEDINGS - COMPUTER AS A TOOL, (2003), vol. br. , str. 134-137 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Stress-induced leakage currents in thin silicon dioxide films (Article) |
| Autori | Pesic Biljana Vracar Ljubomir M Stojadinovic Ninoslav D Pecovska-Djordjevic M Novkovski N |
| Info | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, (2003), vol. 14 br. 10-12, str. 805-807 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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