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Autori: Stojadinovic Ninoslav D

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Naslov Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors (Article)
Autori Davidovic Vojkan S Stojadinovic Ninoslav D Dankovic Danijel M Golubovic Snezana M Manic Ivica Dj Djoric-Veljkovic Snezana M Dimitrijev Sima 
Info JAPANESE JOURNAL OF APPLIED PHYSICS, (2008), vol. 47 br. 8, str. 6272-6276
Projekat Ministry of Science of the Republic of Serbia
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs (Proceedings Paper)
Autori Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D 
Info 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 599-602
Ispravka Web of Science   Citati: Web of Science  
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Naslov Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode (Article)
Autori Atanassova E Stojadinovic Ninoslav D Paskaleva A Spassov D Vracar Ljubomir M Georgieva M 
Info SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2008), vol. 23 br. 7, str. -
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs (Article)
Autori Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D 
Info IET CIRCUITS DEVICES & SYSTEMS, (2008), vol. 2 br. 2, str. 213-221
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs (Proceedings Paper)
Autori Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M 
Info TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2, (2007), vol. br. , str. 275-282
Ispravka Web of Science   Citati: Web of Science  
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Naslov Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors (Article)
Autori Davidovic Vojkan S Kouvatsos DN Stojadinovic Ninoslav D Voutsas AT 
Info MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1841 -1845
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1400 -1405
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2006), vol. 46 br. 9-11, str. 1828-1833
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Electrical stressing effects in commercial power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Lifetime estimation in NBT stressed P-channel power VDMOSFETs (Proceedings Paper)
Autori Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 645-648
Ispravka Web of Science   Citati: Web of Science  
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