Autori: Stojadinovic Ninoslav D
| Naslov | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 1, str. 58-66 |
| Projekat | Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026]; Ei PCB Factory, Nis, Serbia |
| Ispravka | Web of Science Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks (Article) |
| Autori | Atanassova E Stojadinovic Ninoslav D Spassov Dencho Manic Ivica Dj Paskaleva A |
| Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2013), vol. 28 br. 5, str. - |
| Projekat | Bulgarian National Science Foundation [DTK 02/50] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors (Article) |
| Autori | Prijic Aneta P Dankovic Danijel M Vracar Ljubomir M Manic Ivica Dj Prijic Zoran D Stojadinovic Ninoslav D |
| Info | MEASUREMENT SCIENCE & TECHNOLOGY, (2012), vol. 23 br. 8, str. - |
| Projekat | Serbian Ministry of Education and Science[OI171026, TR32026]; Ei PCB Factory, Nis |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions (Article) |
| Autori | Manic Ivica Dj Dankovic Danijel M Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2011), vol. 51 br. 9-11, str. 1540-1543 |
| Projekat | Ministry of Science of the Republic of Serbia[0171026, TR32026] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Annealing of Radiation-induced Defects in Burn-in Stressed Power Vdmosfets (Article) |
| Autori | Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | NUCLEAR TECHNOLOGY & RADIATION PROTECTION, (2011), vol. 26 br. 1, str. 18-24 |
| Projekat | Ministry of Science and Technological Development of Republic of Serbia |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Hf-doped Ta2O5 stacks under constant voltage stress (Article) |
| Autori | Manic Ivica Dj Atanassova E Stojadinovic Ninoslav D Spassov Dencho Paskaleva Albena |
| Info | MICROELECTRONIC ENGINEERING, (2011), vol. 88 br. 3, str. 305-313 |
| Projekat | Bulgarian National Science Foundation [DTK 02/50] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D |
| Info | MICROELECTRONICS RELIABILITY, (2010), vol. 50 br. 9-11, str. 1278-1282 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Manic Ivica Dj Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2009), vol. 49 br. 9-11, str. 1003-1007 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Negative bias temperature instability in n-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 8-9, str. 1313-1317 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode (Proceedings Paper) |
| Autori | Atanassova E Stojadinovic Ninoslav D Paskaleva A |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 8-9, str. 1193-1197 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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