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Autori: Stanimirovic Zdravko I

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Naslov Multiple high-voltage pulse stressing of conventional thick-film resistors (Article)
Autori Stanimirovic Ivanka P  Jevtic Milan M Stanimirovic Zdravko I  
Info MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 12 , Suppl. , str. 2242 -2248
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Influence of simultaneous mechanical and electrical straining on conventional thick-film resistors (Proceedings Paper)
Autori Stanimirovic Zdravko I  Jevtic Milan M Stanimirovic Ivanka P  
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 627-630
Ispravka Web of Science   Citati: Web of Science  
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Naslov Performances of conventional thick-film resistors after multiple high-voltage pulse (Proceedings Paper)
Autori Stanimirovic Ivanka P  Jevtic Milan M Stanimirovic Zdravko I  
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 623-625
Ispravka Web of Science   Citati: Web of Science  
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Naslov Computer simulation of thick-film resistors based on 3D planar RRN model (Proceedings Paper)
Autori Stanimirovic Zdravko I  Jevtic Milan M Stanimirovic Ivanka P  
Info Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1687-1690
Ispravka Web of Science   Citati: Web of Science  
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Naslov Performances of conventional thick-film resistors subjected to mechanical straining (Proceedings Paper)
Autori Stanimirovic Zdravko I  Jevtic Milan M Stanimirovic Ivanka P  
Info 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 675-678
Ispravka Web of Science   Citati: Web of Science  
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Naslov High-voltage pulse stressing of thick-film resistors and noise (Article)
Autori Stanimirovic Ivanka P  Jevtic Milan M Stanimirovic Zdravko I  
Info MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 6, str. 905-911
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Evaluation of thick-film resistor structural parameters based on noise index measurements (Article)
Autori Jevtic Milan M Stanimirovic Zdravko I  Stanimirovic Ivanka P  
Info MICROELECTRONICS RELIABILITY, (2001), vol. 41 br. 1, str. 59-66
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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