Autori: Prijic Aneta P
Naslov | Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET (Article) |
Autori | Dankovic Danijel M Stojadinovic Ninoslav D Prijic Zoran D Manic Ivica Dj Davidovic Vojkan S Prijic Aneta P Djoric-Veljkovic Snezana M Golubovic Snezana M |
Info | CHINESE PHYSICS B, (2015), vol. 24 br. 10, str. - |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Ei PCB Factory, Nis |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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Naslov | Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation (Article) |
Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Djoric-Veljkovic Snezana M Davidovic Vojkan S Stojadinovic Ninoslav D Prijic Zoran D Golubovic Snezana M |
Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2015), vol. 30 br. 10, str. - |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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Naslov | Thermal Energy Harvesting Wireless Sensor Node in Aluminum Core PCB Technology (Article) |
Autori | Prijic Aneta P Vracar Ljubomir M Vuckovic Dusan M ![]() ![]() |
Info | IEEE SENSORS JOURNAL, (2015), vol. 15 br. 1, str. 337-345 |
Projekat | Serbian Ministry of Education, Science and Technological Development [TR32026]; Ei PCB Factory, Nis, Serbia |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Measurement of NBTI Degradation in p-channel Power VDMOSFETs (Article) |
Autori | Manic Ivica Dj Dankovic Danijel M Prijic Aneta P Prijic Zoran D Stojadinovic Ninoslav D |
Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2014), vol. 44 br. 4, str. 280-287 |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Ei PCB Factory, Nis, Serbia |
Ispravka | Web of Science Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | An Electromechanical Approach to a Printed Circuit Board Design Course (Article) |
Autori | Dankovic Danijel M Vracar Ljubomir M Prijic Aneta P Prijic Zoran D |
Info | IEEE TRANSACTIONS ON EDUCATION, (2013), vol. 56 br. 4, str. 470-477 |
Projekat | Serbian Ministry of Education and Science [TR32026]; Ei PCB Factory, Nis, Serbia |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs (Article) |
Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 1, str. 58-66 |
Projekat | Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026]; Ei PCB Factory, Nis, Serbia |
Ispravka | Web of Science Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors (Article) |
Autori | Prijic Aneta P Dankovic Danijel M Vracar Ljubomir M Manic Ivica Dj Prijic Zoran D Stojadinovic Ninoslav D |
Info | MEASUREMENT SCIENCE & TECHNOLOGY, (2012), vol. 23 br. 8, str. - |
Projekat | Serbian Ministry of Education and Science[OI171026, TR32026]; Ei PCB Factory, Nis |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Capacitive Pressure Sensing Based Key in PCB Technology for Industrial Applications (Article) |
Autori | Vracar Ljubomir M Prijic Aneta P Vuckovic Dusan Prijic Zoran D |
Info | IEEE SENSORS JOURNAL, (2012), vol. 12 br. 5, str. 1496-1503 |
Projekat | Serbian Ministry of Education and Science[TR32026]; Ei PCB Factory, Nis |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions (Article) |
Autori | Manic Ivica Dj Dankovic Danijel M Prijic Aneta P Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D Stojadinovic Ninoslav D |
Info | MICROELECTRONICS RELIABILITY, (2011), vol. 51 br. 9-11, str. 1540-1543 |
Projekat | Ministry of Science of the Republic of Serbia[0171026, TR32026] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Design and Optimization of S-Type Thermal Cutoffs (Article) |
Autori | Prijic Aneta P Prijic Zoran D Pesic Biljana Pantic Dragan S ![]() ![]() |
Info | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, (2008), vol. 31 br. 4, str. 904-912 |
Projekat | Serbian Ministry of Science and Technology |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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