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Naslov Spice modeling of oxide and interface trapped charge effects in fully-depleted double-gate FinFETs (Article)
Autori Jankovic Nebojsa D Pesic-Brdjanin Tatjana 
Info JOURNAL OF COMPUTATIONAL ELECTRONICS, (2015), vol. 14 br. 3, str. 844-851
Projekat Ministry of Education and Science Republic of Serbia [OI171026]
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science  
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