Pronađeno: 31-40 / 49 radova

Autori: Manic Ivica Dj

>> Filter: Samo Article i Review

>> Sve godine

Naslov Electrical stressing effects in commercial power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S  Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Lifetime estimation in NBT stressed P-channel power VDMOSFETs (Proceedings Paper)
Autori Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S  Golubovic Snezana M Stojadinovic Ninoslav D 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 645-648
Ispravka Web of Science   Citati: Web of Science  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Spontaneous recovery in DC gate bias stressed power VDMOSFETs (Proceedings Paper)
Autori Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S  Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 639-644
Ispravka Web of Science   Citati: Web of Science  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S  Manic Ivica Dj Golubovic Snezana M 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Effects of electrical stressing in power VDMOSFETS (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S  Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs (Proceedings Paper)
Autori Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S  Golubovic Snezana M Stojadinovic Ninoslav D 
Info 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 701-704
Ispravka Web of Science   Citati: Web of Science  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov An improved analytical model of IGBT in forward conduction mode (Proceedings Paper)
Autori Pavlovic Zoran Manic Ivica Dj Stojadinovic Ninoslav D 
Info 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 163-166
Ispravka Web of Science   Citati: Web of Science  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Effects of electrical stressing in power VDMOSFETs (Proceedings Paper)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S  Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info 2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, (2003), vol. br. , str. 291-296
Ispravka Web of Science   Citati: Web of Science  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (Article)
Autori Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S  Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 9-11, str. 1455-1460
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
Naslov Effects of burn-in stressing on radiation response of power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S  Golubovic Snezana M 
Info MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 899-905
Ispravka Web of Science   Članak   Citati: Web of Science   Scopus  
facebook sharing button
twitter sharing button
linkedin sharing button
gmail sharing button
copy sharing button
>> Sve godine

Ispis zapisa u formatu:TXT | BibTeX