Autori: Manic Ivica Dj
| Naslov | Electrical stressing effects in commercial power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S  Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima
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| Info | IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Lifetime estimation in NBT stressed P-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 645-648 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Spontaneous recovery in DC gate bias stressed power VDMOSFETs (Proceedings Paper) |
| Autori | Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 639-644 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Manic Ivica Dj Golubovic Snezana M
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| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of electrical stressing in power VDMOSFETS (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima
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| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs (Proceedings Paper) |
| Autori | Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 701-704 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | An improved analytical model of IGBT in forward conduction mode (Proceedings Paper) |
| Autori | Pavlovic Zoran Manic Ivica Dj Stojadinovic Ninoslav D |
| Info | 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 163-166 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Effects of electrical stressing in power VDMOSFETs (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima
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| Info | 2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, (2003), vol. br. , str. 291-296 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (Article) |
| Autori | Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 9-11, str. 1455-1460 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of burn-in stressing on radiation response of power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M
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| Info | MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 899-905 |
| Ispravka | Web of Science Članak Citati: Web of Science Scopus |
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