Autori: Manic Ivica Dj
| Naslov | Hf-doped Ta2O5 stacks under constant voltage stress (Article) |
| Autori | Manic Ivica Dj Atanassova E Stojadinovic Ninoslav D Spassov Dencho Paskaleva Albena |
| Info | MICROELECTRONIC ENGINEERING, (2011), vol. 88 br. 3, str. 305-313 |
| Projekat | Bulgarian National Science Foundation [DTK 02/50] |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S  Djoric-Veljkovic Snezana M Golubovic Snezana M Prijic Zoran D
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| Info | MICROELECTRONICS RELIABILITY, (2010), vol. 50 br. 9-11, str. 1278-1282 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Manic Ivica Dj Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | MICROELECTRONICS RELIABILITY, (2009), vol. 49 br. 9-11, str. 1003-1007 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Negative bias temperature instability in n-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 8-9, str. 1313-1317 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors (Article) |
| Autori | Davidovic Vojkan S Stojadinovic Ninoslav D Dankovic Danijel M Golubovic Snezana M Manic Ivica Dj Djoric-Veljkovic Snezana M Dimitrijev Sima
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| Info | JAPANESE JOURNAL OF APPLIED PHYSICS, (2008), vol. 47 br. 8, str. 6272-6276 |
| Projekat | Ministry of Science of the Republic of Serbia |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 599-602 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs (Article) |
| Autori | Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | IET CIRCUITS DEVICES & SYSTEMS, (2008), vol. 2 br. 2, str. 213-221 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M
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| Info | TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2, (2007), vol. br. , str. 275-282 |
| Ispravka | Web of Science Citati: Web of Science |
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| Naslov | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1400 -1405 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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| Naslov | NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D
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| Info | MICROELECTRONICS RELIABILITY, (2006), vol. 46 br. 9-11, str. 1828-1833 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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