Autori: Glavanovics M
Naslov | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements (Proceedings Paper) |
Autori | Hadzi-Vukovic Jovan M Jevtic Milan M Glavanovics M Rothleitner H |
Info | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (2008), vol. 205 br. 11, str. 2544-2547 |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science |
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