Autori: Erich Marko
| Naslov | EBS/C impurity and damage profiling of 4 MeV C implanted MgF2 single crystal (Article) |
| Autori | Gloginjic Marko P  Erich Marko Kokkoris Michael Chen Shanliang Fazinic Stjepko Karlusic Marko Skuratov Vladimir A Kirilkin Nikita S Rajic Vladimir B Petrovic Srdjan M
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| Info | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, (2025), vol. 199 br. , str. - |
| Projekat | Ministry of Science, Technological Development and Innovation of the Republic of Serbia; EU Research and Innovation programme [824096]; Condensed Matter Physics with Ion Beams |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: |
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