Autori: Diebold A
| Naslov | Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials (Article) |
| Autori | Funke S Wurstbauer U Miller B Matkovic Aleksandar  Green Alex Diebold A Roeling C Thiesen PH
|
| Info | APPLIED SURFACE SCIENCE, (2017), vol. 421 br. , str. 435-439 |
| Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
     |
