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Autori: Davidovic Vojkan S

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Naslov Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1400 -1405
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2006), vol. 46 br. 9-11, str. 1828-1833
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Electrical stressing effects in commercial power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Manic Ivica Dj Golubovic Snezana M 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Effects of electrical stressing in power VDMOSFETS (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article)
Autori Kouvatsos DN Davidovic Vojkan S Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D 
Info MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (Article)
Autori Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 9-11, str. 1455-1460
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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Naslov Effects of burn-in stressing on radiation response of power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M 
Info MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 899-905
Ispravka Web of Science   Članak   Citati: Web of Science   Scopus  
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Naslov Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Dimitrijev Sima 
Info MICROELECTRONICS RELIABILITY, (2002), vol. 42 br. 9-11, str. 1465-1468
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science  
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Naslov Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Dimitrijev Sima 
Info MICROELECTRONICS RELIABILITY, (2002), vol. 42 br. 4-5, str. 669-677
Ispravka Web of Science   Članak   Elečas   Rang časopisa   Citati: Web of Science   Scopus  
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