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Autori: Carulli Jr John M

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Naslov Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond (Article)
Autori Huang Ke Liu Yu Korolija Nenad  Carulli Jr John M Makris Yiorgos 
Info IEEE DESIGN & TEST, (2024), vol. 41 br. 2, str. 15-22
Ispravka Web of Science   Članak   Elečas   Rang časopisa  
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