Autori: Spassov Dencho
Naslov | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article) |
Autori | Djoric-Veljkovic Snezana M Zivanovic Emilija N Davidovic Vojkan S Veljkovic Sandra ![]() ![]() |
Info | MICROMACHINES, (2025), vol. 16 br. 1, str. - |
Projekat | European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095] |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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Naslov | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article) |
Autori | Zivanovic Emilija N Veljkovic Sandra ![]() ![]() |
Info | MICROMACHINES, (2024), vol. 15 br. 4, str. - |
Projekat | Serbian Ministry of Science, Technological Development and Innovation |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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Naslov | Self-heating of stressed VDMOS devices under specific operating conditions (Article) |
Autori | Veljkovic Sandra ![]() ![]() ![]() |
Info | MICROELECTRONICS RELIABILITY, (2023), vol. 150 br. , str. - |
Projekat | Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102]; Bulgarian National Scientific Fund [KP-06-H37/32]; [SPS G5974] |
Ispravka | Web of Science Članak Elečas Rang časopisa |
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Naslov | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article) |
Autori | Veljkovic Sandra ![]() ![]() |
Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. - |
Projekat | European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics (Article) |
Autori | Spassov Dencho Paskaleva Albena Guziewicz Elzbieta Davidovic Vojkan S Stankovic Srboljub J Djoric-Veljkovic Snezana M Ivanov Tzvetan Stanchev Todor Stojadinovic Ninoslav D |
Info | MATERIALS, (2021), vol. 14 br. 4, str. - |
Projekat | Bulgarian National Scientific Fund [KP-06-H37/32] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | A review of pulsed NBTI in P-channel power VDMOSFETs (Review) |
Autori | Dankovic Danijel M Manic Ivica Dj Prijic Aneta P Davidovic Vojkan S Prijic Zoran D Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stojadinovic Ninoslav D |
Info | MICROELECTRONICS RELIABILITY, (2018), vol. 82 br. , str. 28-36 |
Projekat | Ministry of Science of the Republic of Serbia [OI-171026, TR-32026]; SASA [F-148] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks (Article) |
Autori | Atanassova E Stojadinovic Ninoslav D Spassov Dencho Manic Ivica Dj Paskaleva A |
Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2013), vol. 28 br. 5, str. - |
Projekat | Bulgarian National Science Foundation [DTK 02/50] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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Naslov | Hf-doped Ta2O5 stacks under constant voltage stress (Article) |
Autori | Manic Ivica Dj Atanassova E Stojadinovic Ninoslav D Spassov Dencho Paskaleva Albena |
Info | MICROELECTRONIC ENGINEERING, (2011), vol. 88 br. 3, str. 305-313 |
Projekat | Bulgarian National Science Foundation [DTK 02/50] |
Ispravka | Web of Science Članak Elečas Rang časopisa Citati: Web of Science Scopus |
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