@ARTICLE{
author={Kokkoris M|,Androulakaki EG|,Czyzycki M|,Eric Marko V|,Karydas Andreas Germanos|,Leani JJ|,Mighori A|,Ntemou E|,Paneta V|,Petrovic Snjezana B|},
year={2019},
title={Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
volume={450},
number={},
pages={144-148},
document_type={Article; Proceedings Paper},
} 

@ARTICLE{
author={Kopsalis I|,Paneta V|,Kokkoris Michael|,Liarokapis Efthymios|,Eric Marko V|,Petrovic Srdjan M|0000-0003-3824-1654,Fazinic Stjepko|,Tadic T|},
year={2014},
title={Probing high-energy ion-implanted silicon by micro-Raman spectroscopy},
journal={JOURNAL OF RAMAN SPECTROSCOPY},
volume={45},
number={8},
pages={650-656},
document_type={Article},
} 

@ARTICLE{
author={Paneta V|,Eric Marko V|,Fazinic Stjepko|,Kokkoris Michael|,Kopsalis I|,Petrovic Srdjan M|0000-0003-3824-1654,Tadic T|},
year={2014},
title={Investigation of deep implanted carbon and oxygen channeling profiles in [110] silicon, using d-NRA and SEM},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
volume={320},
number={},
pages={6-11},
document_type={Article},
} 

@ARTICLE{
author={Eric Marko V|,Petrovic Srdjan M|0000-0003-3824-1654,Kokkoris M|,Lagoyannis A|,Paneta V|,Harissopulos S|,Telecki Igor N|0000-0003-0329-9848},
year={2012},
title={Depth profiling of high energy nitrogen ions implanted in the (100), (110) and randomly oriented silicon crystals},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
volume={274},
number={},
pages={87-92},
document_type={Article},
}