@ARTICLE{
author={Pesic Biljana|,Vracar Ljubomir M|,Stojadinovic Ninoslav D|,Pecovska-Djordjevic M|,Novkovski N|},
year={2003},
title={Stress-induced leakage currents in thin silicon dioxide films},
journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS},
volume={14},
number={10-12},
pages={805-807},
document_type={Article},
}