@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Ilic Stefan D|0000-0002-1721-9039,Andjelkovic Marko S|,Duane Russell|,Palma Alberto J|,Lalena Antonio M|,Krstic Milos D|,Jaksic Aleksandar B|},
year={2022},
title={Sensitivity and fading of irradiated RADFETs with different gate voltages},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT},
volume={1029},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Ilic Stefan D|0000-0002-1721-9039,Veljkovic Sandra|0000-0001-9510-7465,Jevtic Aleksandar S|,Dimitrijevic Strahinja D|,Palma Alberto J|,Stankovic Srboljub J|,Andjelkovic Marko S|},
year={2022},
title={Commercial P-Channel Power VDMOSFET as X-ray Dosimeter},
journal={ELECTRONICS},
volume={11},
number={6},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ilic Stefan D|0000-0002-1721-9039,Andjelkovic Marko S|,Duane Russell|,Palma Alberto J|,Sarajlic Milija J|0000-0002-1267-1827,Stankovic Srboljub J|,Ristic Goran S|0000-0001-7603-6243},
year={2021},
title={Recharging process of commercial floating-gate MOS transistor in dosimetry application},
journal={MICROELECTRONICS RELIABILITY},
volume={126},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Ilic Stefan D|0000-0002-1721-9039,Duane Russell|,Andjelkovic Marko S|,Palma Alberto J|,Lallena Antonio M|,Krstic Milos D|,Stankovic Srboljub J|,Jaksic Aleksandar B|},
year={2021},
title={Radiation sensitive MOSFETs irradiated with various positive gate biases},
journal={JOURNAL OF RADIATION RESEARCH AND APPLIED SCIENCES},
volume={14},
number={1},
pages={353-357},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Andjelkovic Marko S|,Duane Russell|,Palma Alberto J|,Jaksic Aleksandar B|},
year={2021},
title={Radiation and Spontaneous Annealing of Radiation-sensitive Field-effect Transistors with Gate Oxide Thicknesses of 400 and 1000 nm},
journal={SENSORS AND MATERIALS},
volume={33},
number={6},
pages={2109-2116},
document_type={Article},
} 

@ARTICLE{
author={Affolder A|,Andjelkovic Marko S|,...|,(broj koautora 55)|},
year={2016},
title={Charge collection studies in irradiated HV-CMOS particle detectors},
journal={JOURNAL OF INSTRUMENTATION},
volume={11},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Andjelkovic Marko S|,Savovic Svetislav M|0000-0002-9038-2393},
year={2016},
title={The isochronal annealing of irradiated n-channel power VDMOSFETs},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
volume={366},
number={},
pages={171-178},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko S|,Petrovic Vladimir|0000-0002-2052-6232,Stamenkovic Zoran|,Ristic Goran S|0000-0001-7603-6243,Jovanovic Goran S|0000-0002-3995-3314},
year={2015},
title={Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch},
journal={JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS},
volume={31},
number={3},
pages={275-289},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S|0000-0001-7603-6243,Andjelkovic Marko S|,Jaksic Aleksandar B|},
year={2015},
title={The behavior of fixed and switching oxide traps of RADFETs during irradiation up to high absorbed doses},
journal={APPLIED RADIATION AND ISOTOPES},
volume={102},
number={},
pages={29-34},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko S|,Ristic Goran S|0000-0001-7603-6243},
year={2015},
title={Current mode response of phototransistors to gamma radiation},
journal={RADIATION MEASUREMENTS},
volume={75},
number={},
pages={29-38},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko S|,Ristic Goran S|0000-0001-7603-6243,Jaksic Aleksandar B|},
year={2015},
title={Using RADFET for the real-time measurement of gamma radiation dose rate},
journal={MEASUREMENT SCIENCE & TECHNOLOGY},
volume={26},
number={2},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko S|,Ristic Goran S|},
year={2013},
title={Feasibility Study of a Current Mode Gamma Radiation Dosimeter Based on a Commercial Pin Photodiode and a Custom Made Auto-Ranging Electrometer},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={28},
number={1},
pages={73-83},
document_type={Article},
} 

